SN74ALVC244
OCTAL BUFFER/DRIVER
WITH 3-STATE OUTPUTS
SCES188 FEBRUARY 1999
1
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
D
EPIC
TM
(Enhanced-Performance Implanted
CMOS) Submicron Process
D
ESD Protection Exceeds 2000 V Per
MIL-STD-883, Method 3015; Exceeds 200 V
Using Machine Model (C = 200 pF, R = 0)
D
Latch-Up Performance Exceeds 250 mA Per
JESD 17
D
Package Options Include Plastic
Small-Outline (DW, NS), Thin Very
Small-Outline (DGV), and Thin Shrink
Small-Outline (PW) Packages
description
This octal buffer/line driver is designed for 1.65-V to 3.6-V V
CC
operation.
The SN74ALVC244 is organized as two 4-bit line drivers with separate output-enable (OE) inputs. When OE
is low, the device passes data from the A inputs to the Y outputs. When OE is high, the outputs are in the
high-impedance state.
To ensure the high-impedance state during power up or power down, OE should be tied to V
CC
through a pullup
resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.
The SN74ALVC244 is characterized for operation from 40
C to 85
C.
FUNCTION TABLE
(each buffer)
INPUTS
OUTPUT
OE
A
Y
L
H
H
L
L
L
H
X
Z
Copyright
1999, Texas Instruments Incorporated
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
EPIC is a trademark of Texas Instruments Incorporated.
1
2
3
4
5
6
7
8
9
10
20
19
18
17
16
15
14
13
12
11
1OE
1A1
2Y4
1A2
2Y3
1A3
2Y2
1A4
2Y1
GND
V
CC
2OE
1Y1
2A4
1Y2
2A3
1Y3
2A2
1Y4
2A1
DGV, DW, NS, OR PW PACKAGE
(TOP VIEW)
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
SN74ALVC244
OCTAL BUFFER/DRIVER
WITH 3-STATE OUTPUTS
SCES188 FEBRUARY 1999
2
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
logic symbol
2
1A1
4
1A2
6
1A3
8
1A4
EN
1
1Y1
18
1Y2
16
1Y3
14
1Y4
12
11
2A1
13
2A2
15
2A3
17
2A4
EN
19
2Y1
9
2Y2
7
2Y3
5
2Y4
3
1OE
2OE
This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12.
logic diagram (positive logic)
1
2
18
1Y1
1OE
1A1
4
16
1Y2
1A2
6
14
1Y3
1A3
8
12
1Y4
1A4
19
11
9
2Y1
2OE
2A1
13
7
2Y2
2A2
15
5
2Y3
2A3
17
3
2Y4
2A4
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage range, V
CC
0.5 V to 4.6 V
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Input voltage range, V
I
(see Note 1)
0.5 V to 4.6 V
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Output voltage range, V
O
(see Notes 1 and 2)
0.5 V to V
CC
+ 0.5 V
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Input clamp current, I
IK
(V
I
< 0)
50 mA
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Output clamp current, I
OK
(V
O
< 0)
50 mA
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Continuous output current, I
O
50 mA
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Continuous current through V
CC
or GND
100 mA
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Package thermal impedance,
JA
(see Note 3): DGV package
146
C/W
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
DW package
97
C/W
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
NS package
100
C/W
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
PW package
128
C/W
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Storage temperature range, T
stg
65
C to 150
C
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under "recommended operating conditions" is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES:
1. The input negative-voltage and output voltage ratings may be exceeded if the input and output current ratings are observed.
2. This value is limited to 4.6 V maximum.
3. The package thermal impedance is calculated in accordance with JESD 51.
SN74ALVC244
OCTAL BUFFER/DRIVER
WITH 3-STATE OUTPUTS
SCES188 FEBRUARY 1999
3
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
recommended operating conditions (see Note 4)
MIN
MAX
UNIT
VCC
Supply voltage
1.65
3.6
V
VCC = 1.65 V to 1.95 V
0.65
VCC
VIH
High-level input voltage
VCC = 2.3 V to 2.7 V
1.7
V
VCC = 2.7 V to 3.6 V
2
VCC = 1.65 V to 1.95 V
0.35
VCC
VIL
Low-level input voltage
VCC = 2.3 V to 2.7 V
0.7
V
VCC = 2.7 V to 3.6 V
0.8
VI
Input voltage
0
VCC
V
VO
Output voltage
0
VCC
V
VCC = 1.65 V
4
IOH
High level output current
VCC = 2.3 V
12
mA
IOH
High-level output current
VCC = 2.7 V
12
mA
VCC = 3 V
24
VCC = 1.65 V
4
IOL
Low level output current
VCC = 2.3 V
12
mA
IOL
Low-level output current
VCC = 2.7 V
12
mA
VCC = 3 V
24
t/
v
Input transition rise or fall rate
5
ns/V
TA
Operating free-air temperature
40
85
C
NOTE 4: All unused inputs of the device must be held at VCC or GND to ensure proper device operation. Refer to the TI application report,
Implications of Slow or Floating CMOS Inputs, literature number SCBA004.
SN74ALVC244
OCTAL BUFFER/DRIVER
WITH 3-STATE OUTPUTS
SCES188 FEBRUARY 1999
4
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
PARAMETER
TEST CONDITIONS
VCC
MIN
TYP
MAX
UNIT
IOH = 100
A
1.65 V to 3.6 V
VCC0.2
IOH = 4 mA
1.65 V
1.2
IOH = 6 mA
2.3 V
2
VOH
2.3 V
1.7
V
IOH = 12 mA
2.7 V
2.2
3 V
2.4
IOH = 24 mA
3 V
2
IOL = 100
A
1.65 V to 3.6 V
0.2
IOL = 4 mA
1.65 V
0.45
VOL
IOL = 6 mA
2.3 V
0.4
V
VOL
IOL = 12 mA
2.3 V
0.7
V
IOL = 12 mA
2.7 V
0.4
IOL = 24 mA
3 V
0.55
II
VI = VCC or GND
3.6 V
5
A
IOZ
VO = VCC or GND
3.6 V
10
A
ICC
VI = VCC or GND,
IO = 0
3.6 V
10
A
ICC
One input at VCC 0.6 V,
Other inputs at VCC or GND
3 V to 3.6 V
750
A
Ci
Control inputs
VI = VCC or GND
3 3 V
4.5
pF
Ci
Data inputs
VI = VCC or GND
3.3 V
4.5
pF
Co
Outputs
VO = VCC or GND
3.3 V
7.5
pF
All typical values are at VCC = 3.3 V, TA = 25
C.
switching characteristics over recommended operating free-air temperature range (unless
otherwise noted) (see Figures 1 through 3)
PARAMETER
FROM
(INPUT)
TO
(OUTPUT)
VCC = 1.8 V
0.15 V
VCC = 2.5 V
0.2 V
VCC = 2.7 V
VCC = 3.3 V
0.3 V
UNIT
(INPUT)
(OUTPUT)
MIN
MAX
MIN
MAX
MIN
MAX
MIN
MAX
tpd
A
Y
1
4.4
1
3.1
3.1
1.1
2.8
ns
ten
OE
Y
1.8
6.9
1.5
5.4
5.3
1.5
4.5
ns
tdis
OE
Y
1.8
5.9
1
4.1
4.4
1.7
4.2
ns
operating characteristics, T
A
= 25
C
PARAMETER
TEST
VCC = 1.8 V VCC = 2.5 V VCC = 3.3 V
UNIT
PARAMETER
CONDITIONS
TYP
TYP
TYP
UNIT
C d
Power dissipation capacitance
Outputs enabled
CL = 0,
22
23
26
pF
Cpd
per buffer/driver
Outputs disabled
L
,
f = 10 MHz
1
1
1
pF
SN74ALVC244
OCTAL BUFFER/DRIVER
WITH 3-STATE OUTPUTS
SCES188 FEBRUARY 1999
5
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
PARAMETER MEASUREMENT INFORMATION
V
CC
= 1.8 V
0.15 V
VCC/2
VCC/2
VCC/2
VCC/2
VCC/2
VCC/2
VCC/2
VCC/2
VOH
VOL
th
tsu
From Output
Under Test
CL = 30 pF
(see Note A)
LOAD CIRCUIT
S1
Open
GND
1 k
1 k
Output
Control
(low-level
enabling)
Output
Waveform 1
S1 at 2
VCC
(see Note B)
Output
Waveform 2
S1 at Open
(see Note B)
tPZL
tPZH
tPLZ
tPHZ
0 V
VOL + 0.15 V
VOH 0.15 V
0 V
VCC
0 V
0 V
tw
VCC
VCC
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
VOLTAGE WAVEFORMS
PULSE DURATION
VOLTAGE WAVEFORMS
ENABLE AND DISABLE TIMES
Timing
Input
Data
Input
Input
tpd
tPLZ/tPZL
tPHZ/tPZH
Open
2
VCC
GND
TEST
S1
NOTES: A. CL includes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
C. All input pulses are supplied by generators having the following characteristics: PRR
10 MHz, ZO = 50
, tr
2 ns, tf
2 ns.
D. The outputs are measured one at a time with one transition per measurement.
E. tPLZ and tPHZ are the same as tdis.
F. tPZL and tPZH are the same as ten.
G. tPLH and tPHL are the same as tpd.
0 V
VCC
VCC/2
tPHL
VCC/2
VCC/2
VCC
0 V
VOH
VOL
Input
Output
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
VCC/2
VCC/2
tPLH
2
VCC
VCC
Figure 1. Load Circuit and Voltage Waveforms
SN74ALVC244
OCTAL BUFFER/DRIVER
WITH 3-STATE OUTPUTS
SCES188 FEBRUARY 1999
6
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
PARAMETER MEASUREMENT INFORMATION
V
CC
= 2.5 V
0.2 V
VCC/2
VCC/2
VCC/2
VCC/2
VCC/2
VCC/2
VCC/2
VCC/2
VOH
VOL
th
tsu
From Output
Under Test
CL = 30 pF
(see Note A)
LOAD CIRCUIT
S1
Open
GND
500
500
Output
Control
(low-level
enabling)
Output
Waveform 1
S1 at 2
VCC
(see Note B)
Output
Waveform 2
S1 at GND
(see Note B)
tPZL
tPZH
tPLZ
tPHZ
0 V
VOL + 0.15 V
VOH 0.15 V
0 V
VCC
0 V
0 V
tw
VCC
VCC
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
VOLTAGE WAVEFORMS
PULSE DURATION
VOLTAGE WAVEFORMS
ENABLE AND DISABLE TIMES
Timing
Input
Data
Input
Input
tpd
tPLZ/tPZL
tPHZ/tPZH
Open
2
VCC
GND
TEST
S1
NOTES: A. CL includes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
C. All input pulses are supplied by generators having the following characteristics: PRR
10 MHz, ZO = 50
, tr
2 ns, tf
2 ns.
D. The outputs are measured one at a time with one transition per measurement.
E. tPLZ and tPHZ are the same as tdis.
F. tPZL and tPZH are the same as ten.
G. tPLH and tPHL are the same as tpd.
0 V
VCC
VCC/2
tPHL
VCC/2
VCC/2
VCC
0 V
VOH
VOL
Input
Output
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
VCC/2
VCC/2
tPLH
2
VCC
VCC
Figure 2. Load Circuit and Voltage Waveforms
SN74ALVC244
OCTAL BUFFER/DRIVER
WITH 3-STATE OUTPUTS
SCES188 FEBRUARY 1999
7
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
PARAMETER MEASUREMENT INFORMATION
V
CC
= 2.7 V AND 3.3 V
0.3 V
VOH
VOL
th
tsu
From Output
Under Test
CL = 50 pF
(see Note A)
LOAD CIRCUIT
S1
6 V
Open
GND
500
500
tPLH
tPHL
Output
Control
(low-level
enabling)
Output
Waveform 1
S1 at 6 V
(see Note B)
Output
Waveform 2
S1 at GND
(see Note B)
tPZL
tPZH
tPLZ
tPHZ
1.5 V
1.5 V
1.5 V
1.5 V
2.7 V
0 V
1.5 V
1.5 V
VOH
VOL
0 V
1.5 V
VOL + 0.3 V
1.5 V
VOH 0.3 V
0 V
1.5 V
2.7 V
0 V
1.5 V
1.5 V
0 V
2.7 V
0 V
1.5 V
1.5 V
tw
Input
2.7 V
2.7 V
3 V
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
VOLTAGE WAVEFORMS
PULSE DURATION
VOLTAGE WAVEFORMS
ENABLE AND DISABLE TIMES
Timing
Input
Data
Input
Output
Input
tpd
tPLZ/tPZL
tPHZ/tPZH
Open
6 V
GND
TEST
S1
NOTES: A. CL includes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
C. All input pulses are supplied by generators having the following characteristics: PRR
10 MHz, ZO = 50
, tr
2.5 ns, tf
2.5 ns.
D. The outputs are measured one at a time with one transition per measurement.
E. tPLZ and tPHZ are the same as tdis.
F. tPZL and tPZH are the same as ten.
G. tPLH and tPHL are the same as tpd.
Figure 3. Load Circuit and Voltage Waveforms
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any product or service without notice, and advise customers to obtain the latest version of relevant information
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pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI's standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty. Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERTAIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE ("CRITICAL
APPLICATIONS"). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
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TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
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Copyright
1999, Texas Instruments Incorporated
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