Document Outline
- FEATURES
- DESCRIPTION
- QUICK REFERENCE DATA
- FUNCTION TABLE
- ORDERING INFORMATION
- PINNING
- RECOMMENDED OPERATING CONDITIONS
- LIMITING VALUES
- DC CHARACTERISTICS
- AC CHARACTERISTICS
- AC WAVEFORMS
- PACKAGE OUTLINES
- SOT27-1
- SOT108-1
- SOT337-1
- SOT402-1
- SOT762-1
- DATA SHEET STATUS
- DEFINITIONS
- DISCLAIMERS
DATA SHEET
Product specification
Supersedes data of 1997 Aug 26
2003 Jun 30
INTEGRATED CIRCUITS
74HC00; 74HCT00
Quad 2-input NAND gate
2003 Jun 30
2
Philips Semiconductors
Product specification
Quad 2-input NAND gate
74HC00; 74HCT00
FEATURES
Complies with JEDEC standard no. 8-1A
ESD protection:
HBM EIA/JESD22-A114-A exceeds 2000 V
MM EIA/JESD22-A115-A exceeds 200 V
Specified from
-
40 to +85
C and
-
40 to +125
C.
DESCRIPTION
The 74HC00/74HCT00 are high-speed Si-gate CMOS
devices and are pin compatible with low power Schottky
TTL (LSTTL). They are specified in compliance with
JEDEC standard no. 7A.
The 74HC00/74HCT00 provide the 2-input NAND
function.
QUICK REFERENCE DATA
GND = 0 V; T
amb
= 25
C; t
r
= t
f
= 6 ns.
Notes
1. C
PD
is used to determine the dynamic power dissipation (P
D
in
W).
P
D
= C
PD
V
CC
2
f
i
N +
(C
L
V
CC
2
f
o
) where:
f
i
= input frequency in MHz;
f
o
= output frequency in MHz;
C
L
= output load capacitance in pF;
V
CC
= supply voltage in Volts;
N = total load switching outputs;
(C
L
V
CC
2
f
o
) = sum of the outputs.
2. For 74HC00 the condition is V
I
= GND to V
CC
.
For 74HCT00 the condition is V
I
= GND to V
CC
-
1.5 V.
FUNCTION TABLE
See note 1.
Note
1. H = HIGH voltage level;
L = LOW voltage level.
SYMBOL
PARAMETER
CONDITIONS
TYPICAL
UNIT
74HC00
74HCT00
t
PHL
/t
PLH
propagation delay nA, nB to nY
C
L
= 15 pF; V
CC
= 5 V
7
10
ns
C
I
input capacitance
3.5
3.5
pF
C
PD
power dissipation capacitance per gate notes 1 and 2
22
22
pF
INPUT
OUTPUT
nA
nB
nY
L
L
H
L
H
H
H
L
H
H
H
L
2003 Jun 30
3
Philips Semiconductors
Product specification
Quad 2-input NAND gate
74HC00; 74HCT00
ORDERING INFORMATION
TYPE NUMBER
PACKAGE
TEMPERATURE
RANGE
PINS
PACKAGE
MATERIAL
CODE
74HC00N
-
40 to +125
C
14
DIP14
plastic
SOT27-1
74HCT00N
-
40 to +125
C
14
DIP14
plastic
SOT27-1
74HC00D
-
40 to +125
C
14
SO14
plastic
SOT108-1
74HCT00D
-
40 to +125
C
14
SO14
plastic
SOT108-1
74HC00DB
-
40 to +125
C
14
SSOP14
plastic
SOT337-1
74HCT00DB
-
40 to +125
C
14
SSOP14
plastic
SOT337-1
74HC00PW
-
40 to +125
C
14
TSSOP14
plastic
SOT402-1
74HCT00PW
-
40 to +125
C
14
TSSOP14
plastic
SOT402-1
74HC00BQ
-
40 to +125
C
14
DHVQFN14
plastic
SOT762-1
74HCT00BQ
-
40 to +125
C
14
DHVQFN14
plastic
SOT762-1
PINNING
PIN
SYMBOL
DESCRIPTION
1
1A
data input
2
1B
data input
3
1Y
data output
4
2A
data input
5
2B
data input
6
2Y
data output
7
GND
ground (0 V)
8
3Y
data output
9
3A
data input
10
3B
data input
11
4Y
data output
12
4A
data input
13
4B
data input
14
V
CC
supply voltage
Fig.1
Pin configuration DIP14, SO14 and
(T)SSOP14.
handbook, halfpage
00
MNA210
1
2
3
4
5
6
7
1A
1B
1Y
2A
2B
2Y
GND
VCC
4B
4A
4Y
3B
3A
3Y
14
13
12
11
10
9
8
2003 Jun 30
4
Philips Semiconductors
Product specification
Quad 2-input NAND gate
74HC00; 74HCT00
Fig.2 Pin configuration DHVQFN14.
handbook, halfpage
1
14
1A
VCC
7
2
3
4
5
6
1B
1Y
2A
2B
2Y
13
12
11
10
9
4B
4A
4Y
3B
3A
8
GND
3Y
MNA950
GND
(1)
Top view
(1) The die substrate is attached to this pad using conductive die
attach material. It can not be used as a supply pin or input.
handbook, halfpage
MNA211
A
B
Y
Fig.3 Logic diagram (one gate).
handbook, halfpage
MNA212
1Y
1A
3
1B
1
2
2Y
2A
6
2B
4
5
3Y
3A
8
3B
9
10
4Y
4A
11
4B
12
13
Fig.4 Function diagram.
handbook, halfpage
MNA246
3
&
&
&
&
2
1
6
5
4
8
10
9
11
13
12
Fig.5 IEC logic symbol.
2003 Jun 30
5
Philips Semiconductors
Product specification
Quad 2-input NAND gate
74HC00; 74HCT00
RECOMMENDED OPERATING CONDITIONS
LIMITING VALUES
In accordance with the Absolute Maximum Rating System (IEC 60134); voltages are referenced to GND (ground = 0 V).
Note
1. For DIP14 packages: above 70
C derate linearly with 12 mW/K.
For SO14 packages: above 70
C derate linearly with 8 mW/K.
For SSOP14 and TSSOP14 packages: above 60
C derate linearly with 5.5 mW/K.
For DHVQFN14 packages: above 60
C derate linearly with 4.5 mW/K.
SYMBOL
PARAMETER
CONDITIONS
74HC00
74HCT00
UNIT
MIN.
TYP.
MAX.
MIN.
TYP.
MAX.
V
CC
supply voltage
2.0
5.0
6.0
4.5
5.0
5.5
V
V
I
input voltage
0
-
V
CC
0
-
V
CC
V
V
O
output voltage
0
-
V
CC
0
-
V
CC
V
T
amb
operating ambient
temperature
see DC and AC
characteristics per
device
-
40
+25
+125
-
40
+25
+125
C
t
r
, t
f
input rise and fall times
V
CC
= 2.0 V
-
-
1000
-
-
-
ns
V
CC
= 4.5 V
-
6.0
500
-
6.0
500
ns
V
CC
= 6.0 V
-
-
400
-
-
-
ns
SYMBOL
PARAMETER
CONDITIONS
MIN.
MAX.
UNIT
V
CC
supply voltage
-
0.5
+7.0
V
I
IK
input diode current
V
I
<
-
0.5 V or V
I
> V
CC
+ 0.5 V
-
20
mA
I
OK
output diode current
V
O
<
-
0.5 V or V
O
> V
CC
+ 0.5 V
-
20
mA
I
O
output source or sink
current
-
0.5 V < V
O
< V
CC
+ 0.5 V
-
25
mA
I
CC
, I
GND
V
CC
or GND current
-
50
mA
T
stg
storage temperature
-
65
+150
C
P
tot
power dissipation
T
amb
=
-
40 to +125
C; note 1
-
500
mW
2003 Jun 30
6
Philips Semiconductors
Product specification
Quad 2-input NAND gate
74HC00; 74HCT00
DC CHARACTERISTICS
Type 74HC00
At recommended operating conditions; voltages are referenced to GND (ground = 0 V).
SYMBOL
PARAMETER
TEST CONDITIONS
MIN.
TYP.
MAX.
UNIT
OTHER
V
CC
(V)
T
amb
=
-
40 to +85
C; note 1
V
IH
HIGH-level input voltage
2.0
1.5
1.2
-
V
4.5
3.15
2.4
-
V
6.0
4.2
3.2
-
V
V
IL
LOW-level input voltage
2.0
-
0.8
0.5
V
4.5
-
2.1
1.35
V
6.0
-
2.8
1.8
V
V
OH
HIGH-level output voltage
V
I
= V
IH
or V
IL
I
O
=
-
20
A
2.0
1.9
2.0
-
V
I
O
=
-
20
A
4.5
4.4
4.5
-
V
I
O
=
-
20
A
6.0
5.9
6.0
-
V
I
O
=
-
4.0 mA
4.5
3.84
4.32
-
V
I
O
=
-
5.2 mA
6.0
5.34
5.81
-
V
V
OL
LOW-level output voltage
V
I
= V
IH
or V
IL
I
O
= 20
A
2.0
-
0
0.1
V
I
O
= 20
A
4.5
-
0
0.1
V
I
O
= 20
A
6.0
-
0
0.1
V
I
O
= 4.0 mA
4.5
-
0.15
0.33
V
I
O
= 5.2 mA
6.0
-
0.16
0.33
V
I
LI
input leakage current
V
I
= V
CC
or GND
6.0
-
-
1.0
A
I
OZ
3-state output OFF current V
I
= V
IH
or V
IL
;
V
O
= V
CC
or GND
6.0
-
-
.5.0
A
I
CC
quiescent supply current
V
I
= V
CC
or GND; I
O
= 0 6.0
-
-
20
A
2003 Jun 30
7
Philips Semiconductors
Product specification
Quad 2-input NAND gate
74HC00; 74HCT00
Note
1. All typical values are measured at T
amb
= 25
C.
T
amb
=
-
40 to +125
C
V
IH
HIGH-level input voltage
2.0
1.5
-
-
V
4.5
3.15
-
-
V
6.0
4.2
-
-
V
V
IL
LOW-level input voltage
2.0
-
-
0.5
V
4.5
-
-
1.35
V
6.0
-
-
1.8
V
V
OH
HIGH-level output voltage
V
I
= V
IH
or V
IL
I
O
=
-
20
A
2.0
1.9
-
-
V
I
O
=
-
20
A
4.5
4.4
-
-
V
I
O
=
-
20
A
6.0
5.9
-
-
V
I
O
=
-
4.0 mA
4.5
3.7
-
-
V
I
O
=
-
5.2 mA
6.0
5.2
-
-
V
V
OL
LOW-level output voltage
V
I
= V
IH
or V
IL
I
O
= 20
A
2.0
-
-
0.1
V
I
O
= 20
A
4.5
-
-
0.1
V
I
O
= 20
A
6.0
-
-
0.1
V
I
O
= 4.0 mA
4.5
-
-
0.4
V
I
O
= 5.2 mA
6.0
-
-
0.4
V
I
LI
input leakage current
V
I
= V
CC
or GND
6.0
-
-
1.0
A
I
OZ
3-state output OFF current V
I
= V
IH
or V
IL
;
V
O
= V
CC
or GND
6.0
-
-
10.0
A
I
CC
quiescent supply current
V
I
= V
CC
or GND; I
O
= 0 6.0
-
-
40
A
SYMBOL
PARAMETER
TEST CONDITIONS
MIN.
TYP.
MAX.
UNIT
OTHER
V
CC
(V)
2003 Jun 30
8
Philips Semiconductors
Product specification
Quad 2-input NAND gate
74HC00; 74HCT00
Type 74HCT00
At recommended operating conditions; voltages are referenced to GND (ground = 0 V).
Note
1. All typical values are measured at T
amb
= 25
C.
SYMBOL
PARAMETER
TEST CONDITIONS
MIN.
TYP.
MAX.
UNIT
OTHER
V
CC
(V)
T
amb
=
-
40 to +85
C; note 1
V
IH
HIGH-level input voltage
4.5 to 5.5
2.0
1.6
-
V
V
IL
LOW-level input voltage
4.5 to 5.5
-
1.2
0.8
V
V
OH
HIGH-level output voltage
V
I
= V
IH
or V
IL
I
O
=
-
20
A
4.5
4.4
4.5
-
V
I
O
=
-
4.0 mA
4.5
3.84
4.32
-
V
V
OL
LOW-level output voltage
V
I
= V
IH
or V
IL
I
O
= 20
A
4.5
-
0
0.1
V
I
O
= 4.0 mA
4.5
-
0.15
0.33
V
I
LI
input leakage current
V
I
= V
CC
or GND
5.5
-
-
1.0
A
I
OZ
3-state output OFF current
V
I
= V
IH
or V
IL
;
V
O
= V
CC
or GND;
I
O
= 0
5.5
-
-
5.0
A
I
CC
quiescent supply current
V
I
= V
CC
or GND;
I
O
= 0
5.5
-
-
20
A
I
CC
additional supply current per input
V
I
= V
CC
-
2.1 V;
I
O
= 0
4.5 to 5.5
-
150
675
A
T
amb
=
-
40 to +125
C
V
IH
HIGH-level input voltage
4.5 to 5.5
2.0
-
-
V
V
IL
LOW-level input voltage
4.5 to 5.5
-
-
0.8
V
V
OH
HIGH-level output voltage
V
I
= V
IH
or V
IL
I
O
=
-
20
A
4.5
4.4
-
-
V
I
O
=
-
4.0 mA
4.5
3.7
-
-
V
V
OL
LOW-level output voltage
V
I
= V
IH
or V
IL
I
O
= 20
A
4.5
-
-
0.1
V
I
O
= 4.0 mA
4.5
-
-
0.4
V
I
LI
input leakage current
V
I
= V
CC
or GND
5.5
-
-
1.0
A
I
OZ
3-state output OFF current
V
I
= V
IH
or V
IL
;
V
O
= V
CC
or GND;
I
O
= 0
5.5
-
-
10
A
I
CC
quiescent supply current
V
I
= V
CC
or GND;
I
O
= 0
5.5
-
-
40
A
I
CC
additional supply current per input
V
I
= V
CC
-
2.1 V;
I
O
= 0
4.5 to 5.5
-
-
735
A
2003 Jun 30
9
Philips Semiconductors
Product specification
Quad 2-input NAND gate
74HC00; 74HCT00
AC CHARACTERISTICS
Type 74HC00
GND = 0 V; t
r
= t
f
= 6 ns; C
L
= 50 pF.
Note
1. All typical values are measured at T
amb
= 25
C.
Type 74HCT00
GND = 0 V; t
r
= t
f
= 6 ns; C
L
= 50 pF
Note
1. All typical values are measured at T
amb
= 25
C.
SYMBOL
PARAMETER
TEST CONDITIONS
MIN.
TYP.
MAX.
UNIT
WAVEFORMS
V
CC
(V)
T
amb
=
-
40 to +85
C; note 1
t
PHL
/t
PLH
propagation delay nA, nB to nY
see Fig.6
2.0
-
25
115
ns
see Fig.6
4.5
-
9
23
ns
see Fig.6
6.0
-
7
20
ns
t
THL
/t
TLH
output transition time
2.0
-
19
95
ns
4.5
-
7
19
ns
6.0
-
6
16
ns
T
amb
=
-
40 to +125
C
t
PHL
/t
PLH
propagation delay nA, nB to nY
see Fig.6
2.0
-
-
135
ns
see Fig.6
4.5
-
-
27
ns
see Fig.6
6.0
-
-
23
ns
t
THL
/t
TLH
output transition time
2.0
-
-
110
ns
4.5
-
-
22
ns
6.0
-
-
19
ns
SYMBOL
PARAMETER
TEST CONDITIONS
MIN.
TYP
MAX.
UNIT
WAVEFORMS
V
CC
(V)
T
amb
=
-
40 to +85
C; note 1
t
PHL
/t
PLH
propagation delay nA, nB to nY
see Fig.6
4.5
-
12
24
ns
t
THL
/t
TLH
output transition time
4.5
-
-
29
ns
T
amb
=
-
40 to +125
C
t
PHL
/t
PLH
propagation delay nA, nB to nY
see Fig.6
4.5
-
-
29
ns
t
THL
/t
TLH
output transition time
4.5
-
-
22
ns
2003 Jun 30
10
Philips Semiconductors
Product specification
Quad 2-input NAND gate
74HC00; 74HCT00
AC WAVEFORMS
handbook, halfpage
MNA218
tPHL
tTHL
tTLH
tPLH
VM
VM
nA, nB input
nY output
GND
VI
VOH
VOL
Fig.6 Waveforms showing the input (nA, nB) to output (nY) propagation delays.
74HC00: V
M
= 50%; V
I
= GND to V
CC
.
74HCT00: V
M
= 1.3 V; V
I
= GND to 3 V.
2003 Jun 30
11
Philips Semiconductors
Product specification
Quad 2-input NAND gate
74HC00; 74HCT00
PACKAGE OUTLINES
UNIT
A
max.
1
2
(1)
(1)
b
1
c
D
(1)
Z
E
e
M
H
L
REFERENCES
OUTLINE
VERSION
EUROPEAN
PROJECTION
ISSUE DATE
IEC
JEDEC
JEITA
mm
inches
DIMENSIONS (inch dimensions are derived from the original mm dimensions)
SOT27-1
99-12-27
03-02-13
A
min.
A
max.
b
max.
w
M
E
e
1
1.73
1.13
0.53
0.38
0.36
0.23
19.50
18.55
6.48
6.20
3.60
3.05
0.254
2.54
7.62
8.25
7.80
10.0
8.3
2.2
4.2
0.51
3.2
0.068
0.044
0.021
0.015
0.77
0.73
0.014
0.009
0.26
0.24
0.14
0.12
0.01
0.1
0.3
0.32
0.31
0.39
0.33
0.087
0.17
0.02
0.13
050G04
MO-001
SC-501-14
M
H
c
(e )
1
M
E
A
L
seating plane
A
1
w
M
b
1
e
D
A
2
Z
14
1
8
7
b
E
pin 1 index
0
5
10 mm
scale
Note
1. Plastic or metal protrusions of 0.25 mm (0.01 inch) maximum per side are not included.
DIP14: plastic dual in-line package; 14 leads (300 mil)
SOT27-1
2003 Jun 30
12
Philips Semiconductors
Product specification
Quad 2-input NAND gate
74HC00; 74HCT00
UNIT
A
max.
A
1
A
2
A
3
b
p
c
D
(1)
E
(1)
(1)
e
H
E
L
L
p
Q
Z
y
w
v
REFERENCES
OUTLINE
VERSION
EUROPEAN
PROJECTION
ISSUE DATE
IEC
JEDEC
JEITA
mm
inches
1.75
0.25
0.10
1.45
1.25
0.25
0.49
0.36
0.25
0.19
8.75
8.55
4.0
3.8
1.27
6.2
5.8
0.7
0.6
0.7
0.3
8
0
o
o
0.25
0.1
DIMENSIONS (inch dimensions are derived from the original mm dimensions)
Note
1. Plastic or metal protrusions of 0.15 mm (0.006 inch) maximum per side are not included.
1.0
0.4
SOT108-1
X
w
M
A
A
1
A
2
b
p
D
H
E
L
p
Q
detail X
E
Z
e
c
L
v
M
A
(A )
3
A
7
8
1
14
y
076E06
MS-012
pin 1 index
0.069
0.010
0.004
0.057
0.049
0.01
0.019
0.014
0.0100
0.0075
0.35
0.34
0.16
0.15
0.05
1.05
0.041
0.244
0.228
0.028
0.024
0.028
0.012
0.01
0.25
0.01
0.004
0.039
0.016
99-12-27
03-02-19
0
2.5
5 mm
scale
SO14: plastic small outline package; 14 leads; body width 3.9 mm
SOT108-1
2003 Jun 30
13
Philips Semiconductors
Product specification
Quad 2-input NAND gate
74HC00; 74HCT00
UNIT
A
1
A
2
A
3
b
p
c
D
(1)
E
(1)
e
H
E
L
L
p
Q
Z
y
w
v
REFERENCES
OUTLINE
VERSION
EUROPEAN
PROJECTION
ISSUE DATE
IEC
JEDEC
JEITA
mm
0.21
0.05
1.80
1.65
0.25
0.38
0.25
0.20
0.09
6.4
6.0
5.4
5.2
0.65
1.25
0.2
7.9
7.6
1.03
0.63
0.9
0.7
1.4
0.9
8
0
o
o
0.13
0.1
DIMENSIONS (mm are the original dimensions)
Note
1. Plastic or metal protrusions of 0.25 mm maximum per side are not included.
SOT337-1
99-12-27
03-02-19
(1)
w
M
b
p
D
H
E
E
Z
e
c
v
M
A
X
A
y
1
7
14
8
A
A
1
A
2
L
p
Q
detail X
L
(A )
3
MO-150
pin 1 index
0
2.5
5 mm
scale
SSOP14: plastic shrink small outline package; 14 leads; body width 5.3 mm
SOT337-1
A
max.
2
2003 Jun 30
14
Philips Semiconductors
Product specification
Quad 2-input NAND gate
74HC00; 74HCT00
UNIT
A
1
A
2
A
3
b
p
c
D
(1)
E
(2)
(1)
e
H
E
L
L
p
Q
Z
y
w
v
REFERENCES
OUTLINE
VERSION
EUROPEAN
PROJECTION
ISSUE DATE
IEC
JEDEC
JEITA
mm
0.15
0.05
0.95
0.80
0.30
0.19
0.2
0.1
5.1
4.9
4.5
4.3
0.65
6.6
6.2
0.4
0.3
0.72
0.38
8
0
o
o
0.13
0.1
0.2
1
DIMENSIONS (mm are the original dimensions)
Notes
1. Plastic or metal protrusions of 0.15 mm maximum per side are not included.
2. Plastic interlead protrusions of 0.25 mm maximum per side are not included.
0.75
0.50
SOT402-1
MO-153
99-12-27
03-02-18
w
M
b
p
D
Z
e
0.25
1
7
14
8
A
A
1
A
2
L
p
Q
detail X
L
(A )
3
H
E
E
c
v
M
A
X
A
y
0
2.5
5 mm
scale
TSSOP14: plastic thin shrink small outline package; 14 leads; body width 4.4 mm
SOT402-1
A
max.
1.1
pin 1 index
2003 Jun 30
15
Philips Semiconductors
Product specification
Quad 2-input NAND gate
74HC00; 74HCT00
terminal 1
index area
0.5
1
A1
Eh
b
UNIT
y
e
0.2
c
REFERENCES
OUTLINE
VERSION
EUROPEAN
PROJECTION
ISSUE DATE
IEC
JEDEC
JEITA
mm
3.1
2.9
Dh
1.65
1.35
y1
2.6
2.4
1.15
0.85
e1
2
0.30
0.18
0.05
0.00
0.05
0.1
DIMENSIONS (mm are the original dimensions)
SOT762-1
MO-241
- - -
- - -
0.5
0.3
L
0.1
v
0.05
w
0
2.5
5 mm
scale
SOT762-1
DHVQFN14: plastic dual in-line compatible thermal enhanced very thin quad flat package; no leads;
14 terminals; body 2.5 x 3 x 0.85 mm
A
(1)
max.
A
A1
c
detail X
y
y1 C
e
L
Eh
Dh
e
e1
b
2
6
13
9
8
7
1
14
X
D
E
C
B
A
02-10-17
03-01-27
terminal 1
index area
A
C
C
B
v
M
w
M
E
(1)
Note
1. Plastic or metal protrusions of 0.075 mm maximum per side are not included.
D
(1)
2003 Jun 30
16
Philips Semiconductors
Product specification
Quad 2-input NAND gate
74HC00; 74HCT00
DATA SHEET STATUS
Notes
1. Please consult the most recently issued data sheet before initiating or completing a design.
2. The product status of the device(s) described in this data sheet may have changed since this data sheet was
published. The latest information is available on the Internet at URL http://www.semiconductors.philips.com.
3. For data sheets describing multiple type numbers, the highest-level product status determines the data sheet status.
LEVEL
DATA SHEET
STATUS
(1)
PRODUCT
STATUS
(2)(3)
DEFINITION
I
Objective data
Development
This data sheet contains data from the objective specification for product
development. Philips Semiconductors reserves the right to change the
specification in any manner without notice.
II
Preliminary data Qualification
This data sheet contains data from the preliminary specification.
Supplementary data will be published at a later date. Philips
Semiconductors reserves the right to change the specification without
notice, in order to improve the design and supply the best possible
product.
III
Product data
Production
This data sheet contains data from the product specification. Philips
Semiconductors reserves the right to make changes at any time in order
to improve the design, manufacturing and supply. Relevant changes will
be communicated via a Customer Product/Process Change Notification
(CPCN).
DEFINITIONS
Short-form specification
The data in a short-form
specification is extracted from a full data sheet with the
same type number and title. For detailed information see
the relevant data sheet or data handbook.
Limiting values definition
Limiting values given are in
accordance with the Absolute Maximum Rating System
(IEC 60134). Stress above one or more of the limiting
values may cause permanent damage to the device.
These are stress ratings only and operation of the device
at these or at any other conditions above those given in the
Characteristics sections of the specification is not implied.
Exposure to limiting values for extended periods may
affect device reliability.
Application information
Applications that are
described herein for any of these products are for
illustrative purposes only. Philips Semiconductors make
no representation or warranty that such applications will be
suitable for the specified use without further testing or
modification.
DISCLAIMERS
Life support applications
These products are not
designed for use in life support appliances, devices, or
systems where malfunction of these products can
reasonably be expected to result in personal injury. Philips
Semiconductors customers using or selling these products
for use in such applications do so at their own risk and
agree to fully indemnify Philips Semiconductors for any
damages resulting from such application.
Right to make changes
Philips Semiconductors
reserves the right to make changes in the products -
including circuits, standard cells, and/or software -
described or contained herein in order to improve design
and/or performance. When the product is in full production
(status `Production'), relevant changes will be
communicated via a Customer Product/Process Change
Notification (CPCN). Philips Semiconductors assumes no
responsibility or liability for the use of any of these
products, conveys no licence or title under any patent,
copyright, or mask work right to these products, and
makes no representations or warranties that these
products are free from patent, copyright, or mask work
right infringement, unless otherwise specified.
Koninklijke Philips Electronics N.V. 2003
SCA75
All rights are reserved. Reproduction in whole or in part is prohibited without the prior written consent of the copyright owner.
The information presented in this document does not form part of any quotation or contract, is believed to be accurate and reliable and may be changed
without notice. No liability will be accepted by the publisher for any consequence of its use. Publication thereof does not convey nor imply any license
under patent- or other industrial or intellectual property rights.
Philips Semiconductors a worldwide company
Contact information
For additional information please visit http://www.semiconductors.philips.com.
Fax: +31 40 27 24825
For sales offices addresses send e-mail to: sales.addresses@www.semiconductors.philips.com.
Printed in The Netherlands
613508/03/pp
17
Date of release:
2003 Jun 30
Document order number:
9397 750 11258