N-Channel
Enhancement Mode MOSFET
General Purpose Amplifier Switch
IT1750
FEATURES
Low ON Resistance
Low C
dg
High Gain
Low Threshold Voltage
ABSOLUTE MAXIMUM RATINGS
(T
A
= 25
o
C unless otherwise specified)
Drain-Source and Gate-Source Voltage . . . . . . . . . . . . . . 25V
Peak Gate-Source Voltage (Note 1) . . . . . . . . . . . . . . .
125V
Drain Current . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 100mA
Storage Temperature Range . . . . . . . . . . . . . -65
o
C to +200
o
C
Operating Temperature Range . . . . . . . . . . . -65
o
C to +150
o
C
Lead Temperature (Soldering, 10sec) . . . . . . . . . . . . . +300
o
C
Power Dissipation . . . . . . . . . . . . . . . . . . . . . . . . . . . . 375mW
Derate
above
25
o
C . . . . . . . . . . . . . . . . . . . . . . . . 3mW/
o
C
NOTE: Stresses above those listed under "Absolute Maximum
Ratings" may cause permanent damage to the device. These are
stress ratings only and functional operation of the device at these or
any other conditions above those indicated in the operational sections
of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
ORDERING INFORMATION
Part
Package
Temperature Range
IT1750
Hermetic TO-72
-55
o
C to +150
o
C
XIT1750
Sorted Chips in Carriers
-55
o
C to +150
o
C
CORPORATION
PIN CONFIGURATION
TO-72
G
D
C
S
1003
ELECTRICAL CHARACTERISTICS (T
A
= 25
o
C, Body connected to Source and V
BS
= 0 unless otherwise specified)
SYMBOL
PARAMETER
MIN
MAX
UNITS
TEST CONDITIONS
V
GS(th)
Gate to Source Threshold Voltage
0.50
3.0
V
V
DS
= V
GS
, I
D
= 10
A
I
DSS
Drain Leakage Current
10
nA
V
DS
= 10V, V
GS
= 0
I
GSS
Gate Leakage Current
(See note 2)
BV
DSS
Drain Breakdown Voltage
25
V
I
D
= 10
A, V
GS
= 0
r
DS(on)
Drain to Source on Resistance
50
ohms
V
GS
= 20V
I
D(on)
Drain Current
10
mA
V
DS
= V
GS
=10V
Y
fs
Forward Transadmittance
3,000
S
V
DS
= 10V, I
D
= 10mA, f = 1kHz
C
iss
Total Gate Input Capacitance
6.0
pF
I
D
= 10mA, V
DS
= 10V, f = 1MHz (Note 3)
C
dg
Gate to Drain Capacitance
1.6
pF
V
DG
= 10V, f = 1MHz (Note 3)
NOTES: 1. Devices must not be tested at
125V more than once nor longer than 300ms.
2. Actual gate current is immeasurable. Package suppliers are required to guarantee a package leakage of < 10pA.
External package leakage is the dominant mode which is sensitive to both transient and storage environment, which cannot be guaranteed.
3. For design reference only, not 100% tested.
PDF 
ZIP